Hprobe Announces Breakthroughs in MRAM Wafer Testing to Support Production Ramp-up

Breakthrough technology to provide new information that will lead to improved memory device performance and help increase manufacturing yields.

GRENOBLE, FRANCE, December 1, 2022 /EINPresswire.com/ -- Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a new addition to its product line—the RF Pulse Module. This is the first commercially available testing system to both collect statistics of error rate of the memory unit cell and take a deep look into switching dynamics of resistive memories. This breakthrough technology will provide new information that will lead to improved memory device performance. Moreover, because the RF Pulse Module is two orders of magnitude faster than existing devices, it will help increase manufacturing yields.